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SCANNING 2005
April 5–7. Monterey, California, USA
Deadline for abstracts:
February 4, 2005


SCANNING Vol. 19, 286–291 (1997)
© FAMS, Inc.
Received July 30, 1996
Accepted with revision September 25, 1996

Remote Operation of Electron Microscopes

E. Voelkl, L.F. Allard, T.A. Nolan, D. Hill, M. Lehmann*

Oak Ridge National Laboratory, Oak Ridge, Tennessee, USA; *Institute for Applied Physics, University of Tübingen, Tübingen, Germany

Full-text (for Scanning subscribers)

Due to the availability of fast local computer networks such as Ethernet and FDDI and fast point-to-point connections such as T1 and T3 links, the idea of telemicroscopy, including remote control of electron microscopes has gained momentum. Ellisman (1995), Fan et al. (1993), Parvin et al. (1995), and Zaluzec (1995) have discussed facets of systems which support such capabilities. In each of these reports the authors describe new stand-alone software packages that are required to run their systems.

Address for reprints:

E. Voelkl
Oak Ridge National Laboratory
Oak Ridge, TN 37831-6064, USA